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Cited article:

Determination of slopes of microscopic surface features by Nomarski polarization interferometry

Michael B. Dowell, Carl A. Hultman and Gerd M. Rosenblatt
Review of Scientific Instruments 48 (11) 1491 (1977)
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Slip rosettes and dislocation structure formed by microindentations in molybdenum single crystals

E. B. Leiko, A. Luft and E. M. Nadgornii
Physica Status Solidi (a) 44 (1) 285 (1977)
https://doi.org/10.1002/pssa.2210440130

Molecular beam epitaxy of II-VI compounds

Donald L. Smith and Vincent Y. Pickhardt
Journal of Applied Physics 46 (6) 2366 (1975)
https://doi.org/10.1063/1.321915

The measurement of small wedge angles using Nomarski interferometry, and its application to small semiconductor samples

R A Ballingall and R B R-Shersby-Harvie
Journal of Physics E: Scientific Instruments 7 (5) 345 (1974)
https://doi.org/10.1088/0022-3735/7/5/008

Formation of glide bands in Fe–3% Si alloy. II. The shear strain concentrated in glide bands

B. Šesták and V. Novák
Physica Status Solidi (a) 23 (2) 703 (1974)
https://doi.org/10.1002/pssa.2210230243

Incident-light Double-refracting Interference Microscope with Variable Wavefront Shear

M. Pluta
Optica Acta: International Journal of Optics 20 (8) 625 (1973)
https://doi.org/10.1080/713818806

Étude des RugositÉs des Interfaces des Couches Minces D'or par RÉflexion Diffuse de Rayons X Sous Incidence Rasante

Optica Acta: International Journal of Optics 19 (11) 905 (1972)
https://doi.org/10.1080/713818515

Tunneling Study of the Superconducting Proximity Effect in the Thin-Normal Limit

P. W. Wyatt, R. C. Barker and A. Yelon
Physical Review B 6 (11) 4169 (1972)
https://doi.org/10.1103/PhysRevB.6.4169

Oberfl�chenuntersuchungen an der McKee-Farrar-H�ftendoprothese

G. R. Hessert
Archiv f�r Orthop�dische und Unfall-Chirurgie 70 (1) 1 (1971)
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Some fog droplet size distributions obtained by an impaction method

J. A. Garland
Quarterly Journal of the Royal Meteorological Society 97 (414) 483 (1971)
https://doi.org/10.1002/qj.49709741408

The analysis of dislocation structures in fatigued aluminium single crystals exhibiting striations

A. B. Mitchell and D. G. Teer
Philosophical Magazine 22 (176) 399 (1970)
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On some nonelectrochemical methods for investigating the surfaces of electrodes

J.O'M Bockris, A Damjanovic and W.E O'Grady
Journal of Colloid and Interface Science 34 (3) 387 (1970)
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Ferrimagnetic garnet thin films: Growth, structure and some magnetic properties

M. Oron, I. Barlow and W. F. Traber
Journal of Materials Science 4 (3) 271 (1969)
https://doi.org/10.1007/BF00549928

The development of surface orientations on rubbed pyrolytic carbon and their relation to the friction and wear

R D Arnell, J W Midgley and D G Teer
Journal of Physics D: Applied Physics 1 (11) 1543 (1968)
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Reflected Light Interference Microscopy of Living and Fixed Biological Surfaces

ANDREW F. HEGYELI and RUTH JOHNSSON-HEGYELI
Nature 213 (5074) 417 (1967)
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Exciton structure and absorption edge in hexagonal zinc selenide

Proceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences 300 (1462) 326 (1967)
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Etching studies of beryllium oxide crystals

S. B. Austerman, J. B. Newkirk, D. K. Smith and H. W. Newkirk
Journal of Materials Science 2 (4) 378 (1967)
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Discrepancies in the Number of Stacking Faults Revealed by Various Methods in Epitaxial Silicon

G. Dionne
Journal of Applied Physics 38 (8) 3417 (1967)
https://doi.org/10.1063/1.1710137

Interference Contrast Employed to Measure Slopes on Metallographic Specimens

U. Bertocci and T. S. Noggle
Review of Scientific Instruments 37 (12) 1750 (1966)
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Development of large-area 200-volt planar voltage-variable capacitance diodes

G.L. Schnable, A.J. Certa and L.F. Wallace
IEEE Transactions on Electron Devices ED-13 (12) 896 (1966)
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The mechanism of step propagation and pyramid formation on the (100) plane of copper from in situ nomarski-optical studies

A. Damjanovic, M. Paunovic and J.O'M. Bockris
Journal of Electroanalytical Chemistry (1959) 9 (2) 93 (1965)
https://doi.org/10.1016/0022-0728(65)80001-8

Nondestructive Method for Revealing Stacking Faults in Epitaxial Silicon

R. H. Dudley
Journal of Applied Physics 35 (4) 1360 (1964)
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Quelques resultats recents de l'etude microscopique des electrodes au cours de l'electrocristallisation et de la dissolution anodique

I. Epelboin and M. Froment
Electrochimica Acta 6 (1-4) 59 (1962)
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Growth mechanism and defect structures in epitaxial silicon

J. M. Charig, B. A. Joyce, D. J. Stirland and R. W. Bicknell
Philosophical Magazine 7 (83) 1847 (1962)
https://doi.org/10.1080/14786436208213850