| Issue |
Rev. Met. Paris
Volume 100, Number 5, May 2003
Science et Génie des MatériauxMatériaux et microscopies |
|
|---|---|---|
| Page(s) | 523 - 534 | |
| DOI | https://doi.org/10.1051/metal:2003222 | |
| Published online | 17 November 2003 | |
Low energy loss spectroscopy: applications in materials
The low energy loss spectroscopy interpretes the signal resulting from the excitation of the valence or conduction electrons of a material under the impact with an electron beam. The analysis of this signal in terms of plasmon energy, low-loss function or dielectric function gives a lot of informations about the electronic structure and the chemical bonding of the sample. When this spectroscopy is connected with a field emission gun scanning transmission electron microscope (STEM-VG HB5O1) it constitutes a very relevant tool to solve material problems for which nanoanalytical investigations are of prime importance. These performances are illustrated by three examples.
© La Revue de Métallurgie, 2003
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