Rev. Met. Paris
Volume 100, Number 5, May 2003Science et Génie des Matériaux
Matériaux et microscopies
|Page(s)||535 - 540|
|Published online||17 November 2003|
AFM, TEM and nanoindentation characterizations of plastic deformation in metallic multilayers
This communication presents experimental observations of plastic deformation in submicronic metallic multilayers. As the length scale decreases down to the nanometer range, we evidence a major change in deformation mechanisms, plasticity becoming less localized as in traditional slip bands of dislocations. AFM and nanoindentation techniques are used in conjonction with more standard techniques to characterize plastic deformation.
© La Revue de Métallurgie, 2003
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