Rev. Met. Paris
Volume 100, Number 5, May 2003Science et Génie des Matériaux
Matériaux et microscopies
|Page(s)||541 - 549|
|Published online||17 November 2003|
Physical-chemistry of “polygomer” surfaces through AFM force measurements
AFM microscope is used here as a surface forces apparatus at the nanometer scale. We show through several examples that the curves forces (nN) vs. distance (nm) obtained are the physico-chemical signature of the interacting surfaces. From such a curve, chemical, frictional (mobility) and mechanical top surface aspects can be studied.
© La Revue de Métallurgie, 2003
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