| Issue |
Rev. Met. Paris
Volume 97, Number 2, Février 2000
|
|
|---|---|---|
| Page(s) | 277 - 282 | |
| DOI | https://doi.org/10.1051/metal/200097020277 | |
| Published online | 13 January 2017 | |
Image analysis to characterize CVD diamond deposits
Caractérisation de dépôts CVD de diamant par analyse d’images
This paper describes an image analysis procedure developed to characterize the morphology of MPCVD diamond deposits in the early stage of the deposition process. The covering ratio (substrate surface covered by diamond), density and size distribution of diamond islands were measured on scanning microscopy images, using algorithms based either on individual analysis of isolated particles or on a two-dimensional boolean model. As the second procedure just requires to perform global measurements, it has the advantage to remain efficient even for large covering ratios.
© La Revue de Métallurgie 2000
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