| Issue |
Rev. Met. Paris
Volume 100, Number 2, February 2003
Science et Génie des MatériauxJournée Jean Morlet : J.A. SF2M 2001 |
|
|---|---|---|
| Page(s) | 211 - 222 | |
| DOI | https://doi.org/10.1051/metal:2003140 | |
| Published online | 27 March 2003 | |
Measurement of deformation at the atomic scale by high-resolution electron microscopy
A quantitative method is described for the measurememnt of displacements and strains by high-resolution electron microscopy. The image is considered to be composed of periodic sets characterized by Fourier analysis. The local amplitude and geometric phase of lattice fringes can be determined in this way. The analysis of the phase distribution leads to the determination of the local lattice configuration. The method is illustrated by different examples and its application conditions are discussed.
© La Revue de Métallurgie, 2003
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