| Issue |
Rev. Met. Paris
Volume 100, Number 5, May 2003
Science et Génie des MatériauxMatériaux et microscopies |
|
|---|---|---|
| Page(s) | 495 - 506 | |
| DOI | https://doi.org/10.1051/metal:2003219 | |
| Published online | 17 November 2003 | |
Chemical analysis using X-ray and electron spectroscopies
This paper is mainly devoted to the presentation and the illustration of chemical microananalysis methods. Four basic techniques will be successively presented: the energy dispersive X-rays spectroscopy (EDS), the wave dispersive spectroscopy of X-rays (WDS), the electron energy loss spectroscopy (EELS) and the Auger spectroscopy (AES). For each of them, the limitations and advantages will be presented.
© La Revue de Métallurgie, 2003
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