| Issue |
Rev. Met. Paris
Volume 100, Number 5, May 2003
Science et Génie des MatériauxMatériaux et microscopies |
|
|---|---|---|
| Page(s) | 561 - 566 | |
| DOI | https://doi.org/10.1051/metal:2003109 | |
| Published online | 17 November 2003 | |
Contributions of environmental scanning electron microscopy to the characterization of metallic materials
Since its introduction in the early eighties, Environmental Scanning Electron Microscopy (ESEM) proved a particularly useful tool in the characterisation of delicate samples mainly in the field of life sciences. Now, the potential of this equipment (no or little sample preparation, possible dynamic observation and reactivity studies...) is more and more employed in traditional materials domains. Some typical applications of ESEM concerning metallic compounds are presented.
© La Revue de Métallurgie, 2003
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