| Issue |
Rev. Met. Paris
Volume 100, Number 5, May 2003
Science et Génie des MatériauxMatériaux et microscopies |
|
|---|---|---|
| Page(s) | 449 - 462 | |
| DOI | https://doi.org/10.1051/metal:2003215 | |
| Published online | 17 November 2003 | |
Recent developments in transmission electron microscopy imaging
A review of recent developments in imaging with a transmission electron microscope is proposed here. A first part is devoted to applications in the “imaging” mode: interest of field emission, “Z-contrast”, quantitative high resolution electron microscopy and reconstruction techniques. A second part will deal with the “diffraction” mode: convergent beam diffraction and “electron cristallography”.
© La Revue de Métallurgie, 2003
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