Rev. Met. Paris
Volume 100, Number 5, May 2003Science et Génie des Matériaux
Matériaux et microscopies
|Page(s)||449 - 462|
|Published online||17 November 2003|
Recent developments in transmission electron microscopy imaging
A review of recent developments in imaging with a transmission electron microscope is proposed here. A first part is devoted to applications in the “imaging” mode: interest of field emission, “Z-contrast”, quantitative high resolution electron microscopy and reconstruction techniques. A second part will deal with the “diffraction” mode: convergent beam diffraction and “electron cristallography”.
© La Revue de Métallurgie, 2003
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