Rev. Met. Paris
Volume 100, Number 12, December 2003Science et Génie des Matériaux
|Page(s)||1137 - 1149|
|Published online||20 January 2004|
Scale transition models and X-ray stress analysis
In the present paper, a synthesis of the relations between diffraction stress analysis and multiscale modelling is presented. It is found that, although models give good qualitative and quantitative results in the elastic field, the extension to internal stresses of elastic-plastic origin remains semi-quantitative and many studies are still required to obtain a consistent formulation between diffraction and modelling.
© La Revue de Métallurgie, 2003
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