Rev. Met. Paris
Volume 99, Number 4, April 2002Aciéries
|Page(s)||373 - 382|
|Published online||25 October 2002|
Rapid characterization of inclusionary cleanliness in steels by PDA-OES mapping
The recent developments of the Pulse Discrimination Analysis by Optical Emission Spectrometry (PDA-OES) and the application of this technique for static analysis as well as for chemical mapping permit to characterize inclusions or heterogeneities with a size ranging from 2 to 20-30 μm. The present improvements of OES permit the steelmakers to have a more detailed information than by the conventional chemical analysis methods. The fast identification of defects such as inclusions or segregation permits to validate more easily the product quality and to adapt the processes.
© La Revue de Métallurgie, 2002
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